MODEL NO.	DESCRIPTION	US$ PRICE
Meiji ML9720 ML9720 • Polarizing microscope, binocular head with DIN standard eyepiece HWF10X and DIN focusing HWF10XF eyepiece with cross-line reticle. • Centerable quadruple nosepiece with SM Plan strain free objectives 4X, 10X, 40X(S) (Magnification factor: 1.5 X) • Rotatable stage with graduation 360°, with vernier, Abbe condenser NA 1.25 with Iris, filter holder and blue filter. • Rotatable analyzer in sliding in sliding mount with 360° graduations. • Rotatable polarizer in swing-out mount. • Bertrand lens in sliding mount. • Coaxial coarse and fine focus adjustment with graduation • Built-in transmitted light Koehler illuminator with 12V 50W halogen lamp & variable intensity control. • Includes Mica 1/4 wave plate and first order red plate. • Supplied with dust cover in styrofoam case.	Meiji Polarizing microscope	5,200.00
Meiji ML9730 • Same as ML9720 but with trinocular head with beam-splitter	Meiji Polarizing microscope	5,300.00
Meiji ML9710 • Same as ML9720 but with monocular head	Meiji Polarizing microscope	4,800.00

BASIC POLARIZED LIGHT MICROSCOPY TERMINOLOGY
COMPENSATORS & RETARDATION PLATES
Polarized Light microscopy is a useful tool for distinguishing between singly refracting
(optically isotropic) and doubly refracting (optically anisotropic) material. Quantitative
measurements of optical anisotrophy is used in the optical analysis of doubly refracting or
birefringent materials under polarized light. These measurements are made with the aid of
accessory plates called compensators and retardation plates. Retardation plates have a fixed
optical path difference and compensators have a variable optical path difference. The
intermediate tube of the Meiji polarized light microscope houses either sliding or rotatable
analyzer, a sliding Bertrand lens and a slot for insertation of retardation plates and
compensators. The dimensions of the compensator/retardation plate are DIN standard
20mm X 6mm.
QUARTER WAVE-PLATE - The quarter wave length retardation plate is a thin slice of
birefringent material (e.g. mica) cut to a thickness to give 1/4  optical path difference (OPD)
in yellow light of about 145nm. The quarter wave-plate changes linear or plane polarized
light into circularly polarized light. The quarter wave-plate is useful for qualitative analysis of
orthoscopic and conescopic images. The quarter wave plate is also used for assessment of
optical path differences in birefringent specimens. 1/4  plate 145nm
FIRST ORDER RED PLATE - The first order retardation plate is a thin slice of birefringent
material (e.g. gypsum) cut to a thickness to give 1  optical path difference (OPD) for green
light. The first order red plate is frequently used to determine the optical sign (positive or
negative) of a birefrigent specimen and is also utilized for contrast enhancement in weakly
birefringent specimens. The first order red plate produces an interference color having a
typical tint of the first order red. The first order red plate is known by several names, including:
gypsum plate, lambda plate, sensitive tint plate, and full wave plate. 1  plate = 550nm
QUARTZ WEDGE - The quartz wedge is a variable compensator which is designed to
produce a range of retardation values as the wedge is moved in and out of the optical path.
The thin edge of the wedge produces an optical path difference of zero. The optical path
difference increases with increasing thickness of the wedge. Each separate wavelength in the
spectrum produces a series of dark extinction bands of which the OPD is exactly one
wavelength apart. Specimen retardation values can be determined by observing changes in
the polarization properties of birefringent specimens as the wedge thickness in the light path
varies. Meiji’s quartz wedge permits retardation measurements from 1-6 wavelengths.
SENARMONT COMPENSATOR - The Senarmont compensator is useful tool for
measurement of retardation levels of crystals, living organisms and also for measuring
permanent stresses in clear materials. The Senarmont compensator is also used for image
contrast enhancement of weakly birefringent specimens.
ANALYZER - A polar place in the light path after the specimen. The analyzer is removable
from the light path and may be rotatable. The analyzer is used to determine the optical effects
produced by the specimen either in plane or polarized light.
BERTRAND LENS - The Bertrand lens is located above the analyzer. The eyepiece and
Bertrand lens act as a system to focus on the back image plane of the objective. The Bertrand
lens main function is to view interference figures (conoscopic images) which appear in the
back image plane of the objective when the specimen is viewed between crossed polars
using highly convergent light from the condenser.
BIREFRINGENCE - A quantitative expression of the separation of a light beam as it
penetrates a doubly refracting object into two diverging beams..
CONOSCOPIC FIGURE - A pattern consisting of isogyres and/or isochromatic curves
formed in the back image plane of the objective also referred to as an interference figure.
CONOSCOPIC OBSERVATION - Observation of the conoscopic or interference figure by
means of a Bertrand lens.
PLANE-POLARIZED LIGHT - Light with only one vibration direction present.
PLEOCHROISM - A property exhibited by certain crystals of absorbing selectively various
wavelengths of light and of displaying different colors when looked at in the directions of their
various crystal axes.
POLAR - A device which produces plane polarized light from natural light.
POLARIZER - A polar placed in the light path before the specimen.
STRAIN FREE - A term used to signify that microscope objectives and condenser lenses
are selected to have a minimum amount of internal stress in the glass. Strain free optics offers
little or no contribution to the optical path difference of the specimen.